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Home
About Center
Introduction
Center Structure
Organization
Center Image
Location
Contact
People
Professors
Adjunct Professors
Postdoctoral Fellow
Students
Visiting Scholars
Engineers
Administrative staff
Equipment
Material Synthesis
Structure Analysis
Optics
Device Fabrication
Transport
Energy and Environment
Research
Ouantum Material Growth
High-Speed/Low-Power Consumption Electronics
Hot Carrier Energy Harvest
Room Temperature Spintronics
Bose-Einstein Condensation(BEC) in Solids
Achievements
Journals
Patents
Presentations
Seminars
Prize/Award
Projects
Newsroom
News
Activities
Announcements
CHN
湖北工业大学
Equipment
Material Synthesis
Structure Analysis
Optics
Device Fabrication
Transport
Energy and Environment
Structure Analysis
Home
-
Equipment
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Structure Analysis
Atomic Force Microscope（AFM） 1
Atomic Force Microscope（AFM） 2 (Enviornment)
Atomic Force Microscope（AFM） 3 (SSRM + SCM)
Field Emission Scanning Electron Microscope（FESEM）
X-ray Diffractometer（XRD）
X-ray Photoelectron Spectroscopy/Ultraviolet Photoel
Thermogravimetric analysis
Brunauer-Emmett-Teller (BET) Analysis
Inductively coupled plasma-mass spectroscopy
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