X-ray Photoelectron Spectroscopy/Ultraviolet Photoelectron Spectroscopy（XPS/UPS）

• Model (Axis Supra+) and company (SHIMADZU), Location (Structural Characterization Room 3)

    Superuser (Zhengwang Cheng), contacts (18062615897/ wechat ID: zwcheng0310)

• Brief description: 

  XPS/UPS is a general surface-sensitive analysis techniques that can determine the elemental composition, chemical state, and electronic structure of material surfaces by irradiating them with X-ray or ultraviolet light and measuring the kinetic energy of emitted photoelectrons.

• Specifications

    - 5-axis auto-stage system, Auto measurement

    - Energy resolution: 0.45 eV  @ 200 kcps (XPS),

    1.0 Mcps @ 100 meV (UPS)

    - Elemental image, mapping resolution: 1 µm

    - Depth analysis, Bias-voltage available

    - Charge compensation

    - Automated dual anode

    - REELS kit, ISS kit