Atomic Force Microscope（AFM） 3 (SSRM + SCM)

• Model (FX40) and company (Park systems), Location (Structural Characterization Room 1)

    Superuser (Xiang Xing), contacts (18040516270/wechat ID: yiyunjin16)

• Brief description: Atomic force microscopy is general term for a microscope that performs material analysis and surface topography observation of microscopic areas using a probe that scans near the sample surface and detects the physical characteristics

• Specifications

    - Magnetic force microscopy(MFM)

    - Current atomic force microscopy(C-AFM)

    - Lateral force microscopy(LFM)

    - Contact and non-contact mapping

    - Scanning tunneling microscopy(STM)

    - Nanolithography

    - Kelvin probe force microscopy(KPFM)/Scanning Maxwell Stress Microscopy(SMM)

    - Scanning Spreading Resistance Microscope(SSRM)

    - Scanning Capacitance Microscope(SCM)