Atomic Force Microscope（AFM） 2 (Enviornment)

• Model (SPM-9700HT) and company (SHIMADZU), Location (Structural Characterization Room 1)

    Superuser (Zhao Yun), contacts (13316825675/wechat ID: zhaoyun19900716)

• Brief description: Environmental AFM is general term for a microscope that performs material analysis and surface topography observation of microscopic areas using a probe that scans near the sample surface and detects the physical characteristics in both atmospheric and vacuum environments.

• Specifications

    -Temperature: -120℃～300℃

    -Vacuum level: 10^-2 Pa

    -Magnetic force microscopy(MFM)

    - Conductive atomic force microscopy(C-AFM)

    - Lateral force microscopy(LFM)

    - Contact and non-contact mapping

    - Piezoresponse Force Microscope

    - Nanolithography

    - Kelvin probe force microscopy(KPFM)/Scanning Maxwell Stress Microscopy(SMM)