Source:Institute of LQM Author:吴沁柯 Published Date:2026-03-12 Views:
Model(GSE-S200)and company (NAURA, 北方华创), Location (Cleanroom)
Superuser (Jingjing Lu/Qinke Wu), contacts (15377533309/wechat ID: miaomer_777、18428381656/wechat ID: wuqinke122832)
Brief description:
This equipment enables low-damage etching with atomic-level precision on substrates such as silicon wafers, III-V compound semiconductors, metals, and dielectric materials. It is particularly suitable for: Etching of high-k dielectric/metal gates in advanced semiconductor nodes、three-dimensional structuring of micro-nano photonic devices、processing of fragile structures in MEMS device release processes. The ALE system employs two alternating, self-limiting reaction steps—surface modification (e.g., fluorination/chlorination) and desorption of volatile products—to achieve layer-by-layer atomic removal. Its core advantages include:Atomic-Level Etching Control: Etching depth is precisely regulated by the number of cycles, surpassing traditional plasma etching technologies.Non-Damaging Conformality: Ensures uniform etching even on complex 3D structures and nanoporous material surfaces, avoiding plasma-induced sidewall damage.
Specifications:
-Wafer size: <8’
-Gas lines: 8 gas lines, including Ar/O₂/CF₄/SF₆/CHF₃/He/C₄F₆/N₂( or Cl2)
-Etching Materials: SiO2, SiN, Polymer, III-V and etc.
-RF generator: Top electode:13.56 MHz, 1500W(0.1W)-bottom electrode:13.56 MHz, 300W (Pulse controllable)
-Uniformity: uniformity:uniformity:±4%(SiO₂); Low-damage(AlGaN <2nm)
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