Source:Institute of LQM Author:宋兴娟 Published Date:2026-03-12 Views:
Model (150RH ) and company (Kemin), Location (Cleanroom)
Superuser (Xingjuan Song), contacts (15527359929/wechat ID: juan921217826)
Brief description:
ALD is a thin-film deposition technique based on sequential, self-limiting surface reactions. Precursor gases are pulsed into a chamber one at a time, each creating a single atomic layer. This process allows for precise, angstrom-level thickness control, producing exceptionally uniform and conformal coatings, ideal for semiconductor devices and advanced nanomaterials.
Specifications:
-Double-chamber vacuum structure
-Ultra-high aspect ratio, which can exceed 100:1
-Intra-chip non-uniformity ≤±1%@10nmAl2O3, 6 inches
-Deposition Film options: Al2O3, HfO2, ZrO2, TiO2...
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