CHN
Device Fabrication

Atomic Layer Deposition 1 and 2

Source:Institute of LQM      Author:宋兴娟    Published Date:2026-03-12    Views:

  • Model (150RH ) and company (Kemin), Location (Cleanroom)

    Superuser (Xingjuan Song), contacts (15527359929/wechat ID: juan921217826)

  • Brief description

    ALD is a thin-film deposition technique based on sequential, self-limiting surface reactions. Precursor gases are pulsed into a chamber one at a time, each creating a single atomic layer. This process allows for precise, angstrom-level thickness control, producing exceptionally uniform and conformal coatings, ideal for semiconductor devices and advanced nanomaterials.

  • Specifications:

    -Double-chamber vacuum structure

    -Ultra-high aspect ratio, which can exceed 100:1

    -Intra-chip non-uniformity ≤±1%@10nmAl2O3, 6 inches

    -Deposition Film options: Al2O3, HfO2, ZrO2, TiO2...




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