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Semiconductor Device parameter Analyzer (KE4200A-SCS)

Source:Institute of LQM      Author:宋兴娟    Published Date:2026-03-12    Views:

  • Model ( 4200SCS ) and company (Keithley), Location (Device Room 5)

   Superuser (Xingjuan Song), contacts (15527359929/wechat ID: juan921217826)

  • Brief description

    The Keithley 4200-SCS is a modular parametric analyzer that integrates source-measure units (SMUs) to precisely source voltage/current and simultaneously measure the resulting current/voltage. It is primarily used for the complete electrical characterization of semiconductor devices, materials, and processes, enabling I-V, C-V, and pulsed measurements for research and reliability testing.

  • Specifications:    

    -Sample Stage: XYZ three-axis fine-adjustment with a travel range of 100mm x 100mm x 10mm.

    -Microscope Objectives: 5x, 10x, 20x, 50x, and 100x magnification.

    -Camera: 12-megapixel color camera.

    -Mechanical Pump: Provides vacuum for sample chucking/adsorption.

    -Temperature Controller: Room temperature to 400°C.

    -Display: Real-time imaging of the sample under the objective




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