AFM/Raman/PL/TRPL system

• Model (NTEGRA Spectra II, Invia) & company (NT-MDT, Renishaw), Location (Optical Room 2)

    Superuser (Yuting Long), contacts (15071178239)

• Brief description: The NT-MDT AFM and Renishaw Raman/photoluminescence (PL)/time-resolved PL system is used for correlated and separated nanoscale structural and optoelectronic characterization. It provides simultaneous measurements of surface topography, chemical composition, crystal structure, and carrier dynamics, enables comprehensive structural and functional characterization for low-dimensional materials and quantum structures.

• Specifications

    -AFM configuration: upright and side illumination

    -AFM function: AFM, LFM, MFM, EFM, KFM, PFM, force modulation mode, phase imaging, adhesion force imaging, SCM, spreading resistance imaging,  AFM force lithography, AFM voltage lithography

    -Raman function: Raman/PL/TRPL

    -Raman laser: 532 nm, 633 nm, 785 nm

    -Raman polarization (0-360 °), low wavelength for 532 nm laser (10 cm^-1)

    -TRPL time resolution: 40 ps